Characteristics and empirical comparison of simple and complex path analysis in grain yield determination by yield - related traits. Part I. Presentation of methods
Dariusz Gozdowski
dariusz_gozdowski@sggw.edu.plKatedra Doświadczalnictwa i Bioinformatyki, Szkoła Główna Gospodarstwa Wiejskiego w Warszawie (Poland)
Wiesław Mądry
Katedra Doświadczalnictwa i Bioinformatyki, Szkoła Główna Gospodarstwa Wiejskiego w Warszawie (Poland)
Abstract
Evaluation of determination of crop yield by yield-related traits is important in determining both the traits having influence on the yield variability and suitable criteria for breeding of high-yielding genotypes. This paper shows the basis of classical path analysis (established by S. Wright) as well as possibilities and examples of its using to evaluate determination of variability of yield by yield-related traits, that may have direct or indirect effects on crop yielding. The approaches including simple and complex (multilevel) path analysis, in which the yield is determined by different yield-related traits, are presented. Besides the classic path analysis, another methods being the modifications of this analysis, are shortly described.
Keywords:
path analysis, yield-related traits, yield componentsReferences
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Authors
Dariusz Gozdowskidariusz_gozdowski@sggw.edu.pl
Katedra Doświadczalnictwa i Bioinformatyki, Szkoła Główna Gospodarstwa Wiejskiego w Warszawie Poland
Authors
Wiesław MądryKatedra Doświadczalnictwa i Bioinformatyki, Szkoła Główna Gospodarstwa Wiejskiego w Warszawie Poland
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